Integrated circuit design software pdf#

238000004519 manufacturing process Methods 0.000 description 2.

238000005516 engineering process Methods 0.000 description 4.

230000001276 controlling effect Effects 0.000 claims description 8.

239000004065 semiconductor Substances 0.000 title claims abstract description 54.

Assignors: HASEGAWA, TETSU, TOKUNAGA, CHIKAKO Assigned to KABUSHIKI KAISHA TOSHIBA reassignment KABUSHIKI KAISHA TOSHIBA REQUEST FOR CORRECTED COVER SHEET Assignors: HASEGAWA, TETSU, TOKUNAGA, CHIKAKO Publication of US20070079052A1 publication Critical patent/US20070079052A1/en Publication of US7577885B2 publication Critical patent/US7577885B2/en Application granted granted Critical Links Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Priority to JP2005284429A priority Critical patent/JP4782524B2/en Priority to JP2005-284429 priority Application filed by Toshiba Corp filed Critical Toshiba Corp Assigned to KABUSHIKI KAISHA TOSHIBA reassignment KABUSHIKI KAISHA TOSHIBA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Original Assignee Toshiba Corp Priority date (The priority date is an assumption and is not a legal conclusion.

Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) ( en Inventor Tetsu Hasegawa Chikako Tokunaga Current Assignee (The listed assignees may be inaccurate.

Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Active, expires Application number US11/526,881 Other versions US20070079052A1

Integrated circuit design software pdf#

Google Patents Semiconductor integrated circuit, design support software system and automatic test pattern generation systemĭownload PDF Info Publication number US7577885B2 US7577885B2 US11/526,881 US52688106A US7577885B2 US 7577885 B2 US7577885 B2 US 7577885B2 US 52688106 A US52688106 A US 52688106A US 7577885 B2 US7577885 B2 US 7577885B2 Authority US United States Prior art keywords circuit register memory switching output Prior art date Legal status (The legal status is an assumption and is not a legal conclusion. Google Patents US7577885B2 - Semiconductor integrated circuit, design support software system and automatic test pattern generation system US7577885B2 - Semiconductor integrated circuit, design support software system and automatic test pattern generation system